| |
|
|
|
Registro Completo |
|
Biblioteca(s): |
Embrapa Instrumentação. |
|
Data corrente: |
13/09/2005 |
|
Data da última atualização: |
13/02/2012 |
|
Autoria: |
ASSIS, O. B. G.; ALVES, C. R. |
|
Título: |
Complementary analysis by atomic force microscopy of sol-gel films processed by dip-coating technique. |
|
Ano de publicação: |
2001 |
|
Fonte/Imprenta: |
Acta Microscopica, Maracaibo, v. 10, p. 153-156, apr. 2001. Supplement 1. First Latin American Symposium on Scanning Microscopy, São Pedro, SP, apr. 2001. |
|
Idioma: |
Inglês |
|
Conteúdo: |
The morphology and additional surface features of SiO2 films processed via sol-gel were evaluated by atomic force microscopy. Two sintering temperatures, 550 and 650 C were used for densification of gels deposited by dip-coating technique onto Ni plates. |
|
Palavras-Chave: |
Filmes Finos; sol-gel. |
|
Thesaurus Nal: |
silica gel. |
|
Categoria do assunto: |
-- |
|
Marc: |
LEADER 00846naa a2200169 a 4500
001 1029040
005 2012-02-13
008 2001 bl --- 0-- u #d
100 1 $aASSIS, O. B. G.
245 $aComplementary analysis by atomic force microscopy of sol-gel films processed by dip-coating technique.
260 $c2001
520 $aThe morphology and additional surface features of SiO2 films processed via sol-gel were evaluated by atomic force microscopy. Two sintering temperatures, 550 and 650 C were used for densification of gels deposited by dip-coating technique onto Ni plates.
650 $asilica gel
653 $aFilmes Finos
653 $asol-gel
700 1 $aALVES, C. R.
773 $tActa Microscopica, Maracaibo$gv. 10, p. 153-156, apr. 2001. Supplement 1. First Latin American Symposium on Scanning Microscopy, São Pedro, SP, apr. 2001.
Download
Esconder MarcMostrar Marc Completo |
|
Registro original: |
Embrapa Instrumentação (CNPDIA) |
|
|
Biblioteca |
ID |
Origem |
Tipo/Formato |
Classificação |
Cutter |
Registro |
Volume |
Status |
URL |
Voltar
|
|
|
| Registros recuperados : 61 | |
| Registros recuperados : 61 | |
|
| Expressão de busca inválida. Verifique!!! |
|
|
